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Conference Paper

Statistical analysis of low-level material screening measurements via gamma-spectroscopy

MPS-Authors
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Heisel,  M.
Division Prof. Dr. Manfred Lindner, MPI for Nuclear Physics, Max Planck Society;

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Kaether,  F.
Division Prof. Dr. Manfred Lindner, MPI for Nuclear Physics, Max Planck Society;

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Simgen,  H.
Division Prof. Dr. Manfred Lindner, MPI for Nuclear Physics, Max Planck Society;

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Heisel, M., Kaether, F., & Simgen, H. (2009). Statistical analysis of low-level material screening measurements via gamma-spectroscopy. Applied Radiation and Isotopes, 67(5), 741-745.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0011-76AB-F
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