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Transverse Kerker Scattering for Ångström Localization of Nanoparticles

MPG-Autoren
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Bag,  Ankan
Interference Microscopy and Nanooptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;
International Max Planck Research School, Max Planck Institute for the Science of Light, Max Planck Society;

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Neugebauer,  Martin
Interference Microscopy and Nanooptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

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Wozniak,  Pawel
Interference Microscopy and Nanooptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

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Leuchs,  Gerd
Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

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Banzer,  Peter
Interference Microscopy and Nanooptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

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Zitation

Bag, A., Neugebauer, M., Wozniak, P., Leuchs, G., & Banzer, P. (2018). Transverse Kerker Scattering for Ångström Localization of Nanoparticles. arXiv:1804.10176.


Zitierlink: https://hdl.handle.net/21.11116/0000-0002-1A64-1
Zusammenfassung
Angstrom precision localization of a single nanoantenna is a crucial step towards advanced nanometrology, medicine and biophysics. Here, we show that single nanoantenna displacements down to few Angstroms can be resolved with sub-Angstrom precision using an all-optical method. We utilize the tranverse Kerker scattering scheme where a carefully structured light beam excites a combination of multipolar modes inside a dielectric nanoantenna, which then upon interference, scatters directionally into the far-field. We spectrally tune our scheme such that it is most sensitive to the change in directional scattering per nanoantenna displacement. Finally, we experimentally show that antenna displacement down to 3 A˚ is resolvable with a localization precision of 0.6 A˚.