High resolution scanning electron microscope for sequential testing and 
analyses of full-size PFC components of AUG

Balden, M.; Elgeti, S.; Neu, R.; Greuner, H.; Herrmann, A.; Krieger, K.; Rohde, V.; Zammuto, I.; ASDEX Upgrade Team, Max Planck Institute for Plasma Physics, Max Planck Society

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High resolution scanning electron microscope for sequential testing and analyses of full-size PFC components of AUG

MPS-Authors

/persons/resource/persons108606

Balden, M.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons109813

Elgeti, S.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons110046

Neu, R.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;
External Organizations;

/persons/resource/persons109220

Greuner, H.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons109371

Herrmann, A.
Tokamak Scenario Development (E1), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons109704

Krieger, K.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons110279

Rohde, V.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons110860

Zammuto, I.
Tokamak Scenario Development (E1), Max Planck Institute for Plasma Physics, Max Planck Society;

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Citation

Balden, M., Elgeti, S., Neu, R., Greuner, H., Herrmann, A., Krieger, K., et al. (2018). High resolution scanning electron microscope for sequential testing and analyses of full-size PFC components of AUG. Poster presented at 30th Symposium on Fusion Technology (SOFT 2018), Giardini Naxos.

Cite as: https://hdl.handle.net/21.11116/0000-0002-198F-2

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