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Correlative transmission Kikuchi diffraction and atom probe tomography analysis of grain boundaries in Cu(In,Ga) Se2 and CuInS2 in thin film solar cells

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Schwarz,  Torsten
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Stechmann,  Guillaume
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Gault,  Baptiste
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Cojocaru-Mirédin,  Oana
Interface Design in Solar Cells, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
I. Physikalisches Institut (IA), RWTH Aachen, 52074 Aachen, Germany;

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Raabe,  Dierk
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Schwarz, T., Stechmann, G., Gault, B., Cojocaru-Mirédin, O., Würz, R., Lomuscio, A., et al. (2018). Correlative transmission Kikuchi diffraction and atom probe tomography analysis of grain boundaries in Cu(In,Ga) Se2 and CuInS2 in thin film solar cells. Talk presented at APT&M 2018, NIST. Gaithersburg, MD, USA. 2018-06-10 - 2018-06-15.


Cite as: https://hdl.handle.net/21.11116/0000-0001-D5ED-4
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