Channel cracking of β-NiAl thin films on Si substrates

Wellner, Patrick; Kraft, Oliver; Dehm, Gerhard; Andersons, J.; Arzt, Eduard

doi:10.1016/j.actamat.2004.01.023

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Channel cracking of β-NiAl thin films on Si substrates

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Wellner, Patrick
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Dehm, Gerhard
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Arzt, Eduard
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Wellner, P., Kraft, O., Dehm, G., Andersons, J., & Arzt, E. (2004). Channel cracking of β-NiAl thin films on Si substrates. Acta Materialia, 52(8), 2325-2336. doi:10.1016/j.actamat.2004.01.023.

Cite as: https://hdl.handle.net/21.11116/0000-0001-97F2-3

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