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Transmission electron microscopy of fluorapatite-gelatine composite particles prepared using focused ion beam milling

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Volkert,  Cynthia A.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Institut für Materialforschung II, Forschungszentrum Karlsruhe, 76021 Karlsruhe, Germany;

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Busch,  Susanne
Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Heiland,  Birgit
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Dehm,  Gerhard
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Volkert, C. A., Busch, S., Heiland, B., & Dehm, G. (2004). Transmission electron microscopy of fluorapatite-gelatine composite particles prepared using focused ion beam milling. Journal of Microscopy, 214(3), 208-212. doi:10.1111/j.0022-2720.2004.01352.x.


Cite as: https://hdl.handle.net/21.11116/0000-0001-97FA-B
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