Analysis of metalic impurity content by means of VUV and SXR diagnostics in the 
presence of ICRF induced hot-spot on the JET-ILW poloidal limiter

Czarnecka, A.; Krawczyk, N.; Jacquet, P.; Lerche, E.; Bobkov, V.; Challis, C.; Frigione, D.; Graves, J.; Lawson, K. D.; Mantsinen, M.; Meneses, L.; Pawelec, E.; Pütterich, T.; Sertoli, M.; Valisa, M.; Van Eester, D.

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Analysis of metalic impurity content by means of VUV and SXR diagnostics in the presence of ICRF induced hot-spot on the JET-ILW poloidal limiter

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Bobkov, V.
Tokamak Scenario Development (E1), Max Planck Institute for Plasma Physics, Max Planck Society;

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Pütterich, T.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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Czarnecka, A., Krawczyk, N., Jacquet, P., Lerche, E., Bobkov, V., Challis, C., Frigione, D., Graves, J., Lawson, K. D., Mantsinen, M., Meneses, L., Pawelec, E., Pütterich, T., Sertoli, M., Valisa, M., & Van Eester, D. (2018). Analysis of metalic impurity content by means of VUV and SXR diagnostics in the presence of ICRF induced hot-spot on the JET-ILW poloidal limiter. Poster presented at 22nd Topical Conference on High Temperature Plasma Diagnostics (HTPD 2018), San Diego, CA.

引用: https://hdl.handle.net/21.11116/0000-0001-2B3B-E

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