Growth, Morphology and Structure of Ultra-Thin Silica Films Studied by 
Spectro-Microscopy

Schmidt, Thomas

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Talk

Growth, Morphology and Structure of Ultra-Thin Silica Films Studied by Spectro-Microscopy

MPS-Authors

/persons/resource/persons22076

Schmidt, Thomas
Chemical Physics, Fritz Haber Institute, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Schmidt, T. (2017). Growth, Morphology and Structure of Ultra-Thin Silica Films Studied by Spectro-Microscopy. Talk presented at FHI/CP-USTC/CP Workshop on Surface Chemistry of Oxides. Hefei, China. 2017-06.

Cite as: https://hdl.handle.net/21.11116/0000-0000-CEBC-5

Abstract

There is no abstract available