Noise reduction in CCD measurements by improving the quality of dark-reference 
images

Heil, Tobias; Tatlock, Gordon J.

doi:10.1093/jmicro/dfy006

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Noise reduction in CCD measurements by improving the quality of dark-reference images

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Heil, Tobias
Nadezda V. Tarakina, Kolloidchemie, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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引用

Heil, T., & Tatlock, G. J. (2018). Noise reduction in CCD measurements by improving the quality of dark-reference images. Microscopy, 67(suppl_1), i123-i132. doi:10.1093/jmicro/dfy006.

引用: https://hdl.handle.net/21.11116/0000-0000-8421-5

要旨

This publication is a systematic investigation of the effect the improvement of dark-reference images has on the resulting bright-field images. For this, data were acquired with three different charge-coupled device cameras attached to two different transmission electron microscopes. Multi-frame acquisitions and methods to correct x-ray noise are introduced and quantified as options to improve the dark-reference images. Furthermore, the influence of x-ray noise on transmission electron microscopy measurements is discussed and observations on its composition are shared.