Origin of Structural Modulations in Ultrathin Fe Films on Cu(001)

Zhang, Xie; Hickel, Tilmann; Rogal, Jutta; Neugebauer, Jörg

doi:10.1103/PhysRevLett.118.236101

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Origin of Structural Modulations in Ultrathin Fe Films on Cu(001)

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Zhang, Xie
Computational Phase Studies, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Hickel, Tilmann
Computational Phase Studies, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Neugebauer, Jörg
Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zhang, X., Hickel, T., Rogal, J., & Neugebauer, J. (2017). Origin of Structural Modulations in Ultrathin Fe Films on Cu(001). Physical Review Letters, 118(23): 236101. doi:10.1103/PhysRevLett.118.236101.

Cite as: https://hdl.handle.net/11858/00-001M-0000-002E-8C96-C

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