Comparative analysis of impulse and impedance tests to detect short circuits 
within the W7-X magnets

Ehmler, H.; Baldzuhn, J.; Rummel, T.; Riße, K.; Fillunger, H.; Maix, R.; Jeckle, A.; Parodi, S.; Scheller, H.

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Comparative analysis of impulse and impedance tests to detect short circuits within the W7-X magnets

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Ehmler, H.
W7-X: Basic Device, Max Planck Institute for Plasma Physics, Max Planck Society;

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Baldzuhn, J.
W7-X: Basic Device, Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons110294

Rummel, T.
W7-X: Operations (OP), Max Planck Institute for Plasma Physics, Max Planck Society;
W7-X: Construction, Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons110270

Riße, K.
W7-X: Construction, Max Planck Institute for Plasma Physics, Max Planck Society;

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Citation

Ehmler, H., Baldzuhn, J., Rummel, T., Riße, K., Fillunger, H., Maix, R., et al. (2005). Comparative analysis of impulse and impedance tests to detect short circuits within the W7-X magnets. Poster presented at 19th International Conference on Magnet Technology (MT 19), Genova.

Cite as: https://hdl.handle.net/21.11116/0000-0000-10B0-6

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