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Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers

MPG-Autoren
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Heymann,  Michael
Schwille, Petra / Cellular and Molecular Biophysics, Max Planck Institute of Biochemistry, Max Planck Society;

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Zitation

Wiedorn, M. O., Awel, S., Morgan, A. J., Barthelmess, M., Bean, R., Beyerlein, K. R., et al. (2017). Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers. Journal of Synchrotron Radiation, 24, 1296-1298. doi:10.1107/S1600577517011961.


Zitierlink: https://hdl.handle.net/11858/00-001M-0000-002E-8B1F-6
Zusammenfassung
The success of diffraction experiments from weakly scattering samples strongly depends on achieving an optimal signal-to-noise ratio. This is particularly important in single-particle imaging experiments where diffraction signals are typically very weak and the experiments are often accompanied by significant background scattering. A simple way to tremendously reduce background scattering by placing an aperture downstream of the sample has been developed and its application in a single-particle X-ray imaging experiment at FLASH is demonstrated. Using the concept of a post-sample aperture it was possible to reduce the background scattering levels by two orders of magnitude.