English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
Add to Basket
  DetailsSummary

Released
Conference Paper

Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy

MPS-Authors
/persons/resource/persons136321

Hieke,  Stefan Werner
Nanoanalytics and Interfaces, Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons75388

Dehm,  Gerhard
Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons76047

Scheu,  Christina Ulrike
Nanoanalytics and Interfaces, Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Hieke, S. W., Dehm, G., & Scheu, C. U. (2016). Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. In European Microscopy Congress 2016: Proceedings (pp. 203-204). Wiley-VCH Verlag GmbH & Co KGaA. doi:10.1002/9783527808465.EMC2016.5892.


Cite as: https://hdl.handle.net/11858/00-001M-0000-002E-059D-1
Abstract
There is no abstract available