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Conference Paper

Towards a Quality Metric for Dense Light Fields

MPS-Authors
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Adhikarla,  Vamsi Kiran
Computer Graphics, MPI for Informatics, Max Planck Society;

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Vinkler,  Marek
Computer Graphics, MPI for Informatics, Max Planck Society;

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Sumin,  Denis
Computer Graphics, MPI for Informatics, Max Planck Society;

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Myszkowski,  Karol
Computer Graphics, MPI for Informatics, Max Planck Society;

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Seidel,  Hans-Peter
Computer Graphics, MPI for Informatics, Max Planck Society;

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Didyk,  Piotr
Computer Graphics, MPI for Informatics, Max Planck Society;

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Citation

Adhikarla, V. K., Vinkler, M., Sumin, D., Mantiuk, R., Myszkowski, K., Seidel, H.-P., et al. (in press). Towards a Quality Metric for Dense Light Fields. In 30th IEEE Conference on Computer Vision and Pattern Recognition. Piscataway, NJ: IEEE.


Cite as: https://hdl.handle.net/11858/00-001M-0000-002D-E476-3
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