Microstructure analysis of silicon nanocrystals formed from silicon rich oxide 
with high excess silicon: Annealing and doping effects

Nomoto, Keita; Yang, Terry Chien Jen; Ceguerra, Anna Vallarta; Zhang, Tian; Lin, Ziyun; Breen, Andrew J.; Wu, Liangcai; Puthen-Veettil, Binesh; Jia, Xuguang; Conibeer, Gavin J.; van Perez-Wurfl, I.; Ringer, Simon P.

doi:10.1063/1.4990983

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Microstructure analysis of silicon nanocrystals formed from silicon rich oxide with high excess silicon: Annealing and doping effects

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Breen, Andrew J.
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Nomoto, K., Yang, T. C. J., Ceguerra, A. V., Zhang, T., Lin, Z., Breen, A. J., et al. (2017). Microstructure analysis of silicon nanocrystals formed from silicon rich oxide with high excess silicon: Annealing and doping effects. Journal of Applied Physics, 122(2): 025102, pp. 1-9. doi:10.1063/1.4990983.

Cite as: https://hdl.handle.net/11858/00-001M-0000-002D-E749-2

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