The EIGER detector for low-energy electron microscopy and photoemission 
electron microscopy

Tinti, G.; Marchetto, Helder; Vaz, C. A. F.; Kleibert, A.; Andrä, M.; Barten, R.; Bergamaschi, A.; Brückner, M.; Cartier, S.; Dinapoli, R.; Franz, T.; Fröjdh, E.; Greiffenberg, D.; Lopez-Cuenca, C.; Mezza, D.; Mozzanica, A.; Nolting, F.; Ramilli, M.; Redford, S.; Ruat, M.; Ruder, C.; Schädler, L.; Schmidt, Thomas; Schmitt, B.; Schütz, F.; Shi, X.; Thattil, D.; Vetter, S.; Zhang, J.

doi:10.1107/S1600577517009109

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Journal Article

The EIGER detector for low-energy electron microscopy and photoemission electron microscopy

MPS-Authors

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Marchetto, Helder
ELMITEC Elektronenmikroskopie GmbH;
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Schmidt, Thomas
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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2017-JSyncRad-The EIGER detector for LEEM and PEEM.pdf
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Citation

Tinti, G., Marchetto, H., Vaz, C. A. F., Kleibert, A., Andrä, M., Barten, R., et al. (2017). The EIGER detector for low-energy electron microscopy and photoemission electron microscopy. Journal of Synchrotron Radiation, 24(5), 963-974. doi:10.1107/S1600577517009109.

Cite as: https://hdl.handle.net/11858/00-001M-0000-002D-C799-0

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