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Microstructural and Electronic Characterization of CdTe Thin Film Solar Cells: A Correlative SEM-Based Approach

MPS-Authors
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Stechmann,  Guillaume
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zaefferer,  Stefan
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Konijnenberg,  Peter Joachim
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Bruker Nano GmbH, Am Studio 2D, 12489 Berlin, Germany;

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Citation

Stechmann, G., Zaefferer, S., & Konijnenberg, P. J. (2016). Microstructural and Electronic Characterization of CdTe Thin Film Solar Cells: A Correlative SEM-Based Approach. Poster presented at IAMNano, Port Elizabeth, South Africa.


Cite as: https://hdl.handle.net/11858/00-001M-0000-002D-94C7-E
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