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Assessment of elemental distributions at line and planar defects in Cu(In,Ga)Se2 thin films by atom probe tomography

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Cojocaru-Mirédin,  Oana
RWTH Aachen, I. Physikalisches Institut IA, Sommerfeldstraße 14, 52074 Aachen, Germany;
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Schwarz,  Torsten
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Cojocaru-Mirédin, O., Schwarz, T., & Abou-Ras, D. (2018). Assessment of elemental distributions at line and planar defects in Cu(In,Ga)Se2 thin films by atom probe tomography. Scripta Materialia, 148, 106-114. doi:10.1016/j.scriptamat.2017.03.034.


Cite as: https://hdl.handle.net/21.11116/0000-0001-21A2-2
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