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A correlative investigation of grain boundary crystallography and electronic properties in CdTe thin film solar cells

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Stechmann,  Guillaume
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zaefferer,  Stefan
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Schwarz,  Torsten
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Konijnenberg,  Peter Joachim
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Bruker Nano GmbH, Am Studio 2D, 12489 Berlin, Germany;

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Raabe,  Dierk
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Stechmann, G., Zaefferer, S., Schwarz, T., Konijnenberg, P. J., Raabe, D., Gretener, C., et al. (2017). A correlative investigation of grain boundary crystallography and electronic properties in CdTe thin film solar cells. Solar Energy Materials and Solar Cells, 166, 108-120. doi:10.1016/j.solmat.2017.03.022.


Cite as: https://hdl.handle.net/11858/00-001M-0000-002D-956F-C
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