English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Journal Article

Titanium-silicon oxide film structures for polarization-modulated infrared reflection absorption spectroscopy

MPS-Authors
/persons/resource/persons75423

Dunlop,  Iain E.
Cellular Biophysics, Max Planck Institute for Medical Research, Max Planck Society;

/persons/resource/persons76135

Spatz,  Joachim P.
Cellular Biophysics, Max Planck Institute for Medical Research, Max Planck Society;
Biophysical Chemistry, Institute of Physical Chemistry, University of Heidelberg, 69120 Heidelberg, Germany;

Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Dunlop, I. E., Zorn, S., Richter, G., Srot, V., Kelsch, M., van Aken, P. A., et al. (2009). Titanium-silicon oxide film structures for polarization-modulated infrared reflection absorption spectroscopy. Thin Solid Films, 517(6), 2048-2054. doi:10.1016/j.tsf.2008.10.058.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-3D50-A
Abstract
We present a titanium-silicon oxide film structure that permits polarization modulated infrared reflection absorption spectroscopy on silicon oxide surfaces. The structure consists of a ∼ 6 nm sputtered silicon oxide film on a ∼ 200 nm sputtered titanium film. Characterization using conventional and scanning transmission electron microscopy, electron energy loss spectroscopy, X-ray photoelectron spectroscopy and X-ray reflectometry is presented. We demonstrate the use of this structure to investigate a selectively protein-resistant self-assembled monolayer (SAM) consisting of silane-anchored, biotin-terminated poly(ethylene glycol) (PEG). PEG-associated IR bands were observed. Measurements of protein-characteristic band intensities showed that this SAM adsorbed streptavidin whereas it repelled bovine serum albumin, as had been expected from its structure.