Phase-shifting point-diffraction interferometry with common-path and in-line 
configuration for microscopy

Gao, Peng; Harder, Irina; Nercissian, Vanusch; Mantel, Klaus; Yao, Baoli

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Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy

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Harder, Irina
Optical Design and Microoptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

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Nercissian, Vanusch
Optical Design and Microoptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

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Mantel, Klaus
Optical Design and Microoptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

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引用

Gao, P., Harder, I., Nercissian, V., Mantel, K., & Yao, B. (2010). Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy. OPTICS LETTERS, 35(5), 712-714.

引用: https://hdl.handle.net/11858/00-001M-0000-002D-6B29-4

要旨

A new common-path and in-line point-diffraction interferometer for quantitative phase microscopy is proposed. The interferometer is constructed by introducing a grating pair into the point-diffraction interferometer, thus forming a common-path and in-line configuration for object and reference waves. Achromatic phase shifting is implemented by linearly moving one of the two gratings in its grating vector direction. The feasibility of the proposed configuration is demonstrated by theoretical analysis and experiments. (C) 2010 Optical Society of America