Deutsch
 
Hilfe Datenschutzhinweis Impressum
  DetailsucheBrowse

Datensatz

DATENSATZ AKTIONENEXPORT

Freigegeben

Zeitschriftenartikel

Ordered arrays of epitaxial silicon nanowires produced by nanosphere lithography and chemical vapor deposition

MPG-Autoren
/persons/resource/persons201040

Christiansen,  Silke
Christiansen Research Group, Research Groups, Max Planck Institute for the Science of Light, Max Planck Society;
Micro- & Nanostructuring, Technology Development and Service Units, Max Planck Institute for the Science of Light, Max Planck Society;

Externe Ressourcen
Es sind keine externen Ressourcen hinterlegt
Volltexte (beschränkter Zugriff)
Für Ihren IP-Bereich sind aktuell keine Volltexte freigegeben.
Volltexte (frei zugänglich)
Es sind keine frei zugänglichen Volltexte in PuRe verfügbar
Ergänzendes Material (frei zugänglich)
Es sind keine frei zugänglichen Ergänzenden Materialien verfügbar
Zitation

Lerose, D., Bechelany, M., Philippe, L., Michler, J., & Christiansen, S. (2010). Ordered arrays of epitaxial silicon nanowires produced by nanosphere lithography and chemical vapor deposition. JOURNAL OF CRYSTAL GROWTH, 312(20), 2887-2891. doi:10.1016/j.jcrysgro.2010.07.023.


Zitierlink: https://hdl.handle.net/11858/00-001M-0000-002D-6A9F-2
Zusammenfassung
Gold dot arrays on (1 1 1) Si substrates obtained through nanosphere lithography (NSL) combined with sputtering and annealing in Ar at 1000 degrees C are used to catalyze vapor liquid solid (VLS) epitaxial growth of silicon nanowires (Si NWs) using chemical vapor deposition (CVD) with SiH(4) in Ar. The NWs grow primarily epitaxially on the underlying (1 1 1) Si wafer following the four independent < 1 1 1 > directions. The diameter distribution of the wires reflects the diameter distribution of the catalyst gold dot arrays and is therefore predictable. The wire length depends on the size of the gold catalyst for the same CVD parameters. The wire position is foreseeable within the limits of the pattern geometrical quality, but one-to-one growth of NWs to gold dots is not always observed, probably due to (very locally) the remaining presence of silicon oxide. Overall, this inexpensive patterning method for obtaining high-quality crystalline VLS Si NWs by CVD fulfills the requirements of many device applications, where patterning control, quality and reproducibility of the nanostructures are crucial. (C) 2010 Elsevier B.V. All rights reserved.