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Conference Paper

Reconstruction of tightly focused beams using Mie-scattering

MPS-Authors
/persons/resource/persons201012

Bauer,  Thomas
Interference Microscopy and Nanooptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

/persons/resource/persons201145

Orlov,  Sergej
Interference Microscopy and Nanooptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

/persons/resource/persons201152

Peschel,  Ulf
Nonlinear Optics and Nanophotonics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

/persons/resource/persons201008

Banzer,  Peter
International Max Planck Research School, Max Planck Institute for the Science of Light, Max Planck Society;
Interference Microscopy and Nanooptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

/persons/resource/persons201115

Leuchs,  Gerd
Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

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Citation

Bauer, T., Orlov, S., Peschel, U., Banzer, P., & Leuchs, G. (2012). Reconstruction of tightly focused beams using Mie-scattering. In 2012 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO). 345 E 47TH ST, NEW YORK, NY 10017 USA: IEEE.


Cite as: https://hdl.handle.net/11858/00-001M-0000-002D-6915-D
Abstract
By using a sub-wavelength nano-particle as a field probe and a tailored detection scheme we are able to reconstruct the electric energy density in the focal plane of a high numerical aperture focusing system. (C) 2011 Optical Society of America