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Polarization-controlled directional scattering for nanoscopic position sensing

MPG-Autoren
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Neugebauer,  Martin
Interference Microscopy and Nanooptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

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Wozniak,  Pawel
Interference Microscopy and Nanooptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

Bag,  Ankan
Interference Microscopy and Nanooptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;
International Max Planck Research School, Max Planck Institute for the Science of Light, Max Planck Society;

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Leuchs,  Gerd
Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

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Banzer,  Peter
Interference Microscopy and Nanooptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

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Zitation

Neugebauer, M., Wozniak, P., Bag, A., Leuchs, G., & Banzer, P. (2016). Polarization-controlled directional scattering for nanoscopic position sensing. NATURE COMMUNICATIONS, 7: 11286. doi:10.1038/ncomms11286.


Zitierlink: https://hdl.handle.net/11858/00-001M-0000-002D-62E9-D
Zusammenfassung
Controlling the propagation and coupling of light to sub-wavelength antennas is a crucial prerequisite for many nanoscale optical devices. Recently, the main focus of attention has been directed towards high-refractive-index materials such as silicon as an integral part of the antenna design. This development is motivated by the rich spectral properties of individual high-refractive-index nanoparticles. Here we take advantage of the interference of their magnetic and electric resonances to achieve strong lateral directionality. For controlled excitation of a spherical silicon nanoantenna, we use tightly focused radially polarized light. The resultant directional emission depends on the antenna's position relative to the focus. This approach finds application as a novel position sensing technique, which might be implemented in modern nanometrology and super-resolution microscopy set-ups. We demonstrate in a proof-of-concept experiment that a lateral resolution in the Angstrom regime can be achieved.