Deutsch
 
Hilfe Datenschutzhinweis Impressum
  DetailsucheBrowse

Datensatz

DATENSATZ AKTIONENEXPORT

Freigegeben

Zeitschriftenartikel

Transverse and longitudinal characterization of electron beams using interaction with optical near-fields

MPG-Autoren
/persons/resource/persons60575

Hommelhoff,  Peter
Hommelhoff Group, Associated Groups, Max Planck Institute for the Science of Light, Max Planck Society;

Externe Ressourcen
Es sind keine externen Ressourcen hinterlegt
Volltexte (beschränkter Zugriff)
Für Ihren IP-Bereich sind aktuell keine Volltexte freigegeben.
Volltexte (frei zugänglich)
Es sind keine frei zugänglichen Volltexte in PuRe verfügbar
Ergänzendes Material (frei zugänglich)
Es sind keine frei zugänglichen Ergänzenden Materialien verfügbar
Zitation

Kozak, M., McNeur, J., Leedle, K. J., Deng, H., Schoenenberger, N., Ruehl, A., et al. (2016). Transverse and longitudinal characterization of electron beams using interaction with optical near-fields. OPTICS LETTERS, 41(15), 3435-3438. doi:10.1364/OL.41.003435.


Zitierlink: https://hdl.handle.net/11858/00-001M-0000-002D-629D-8
Zusammenfassung
We demonstrate an experimental technique for both transverse and longitudinal characterization of bunched femtosecond free electron beams. The operation principle is based on monitoring of the current of electrons that obtained an energy gain during the interaction with the synchronized optical near-field wave excited by femtosecond laser pulses. The synchronous accelerating/decelerating fields confined to the surface of a silicon nanostructure are characterized using a highly focused sub-relativistic electron beam. Here the transverse spatial resolution of 450 nm and femtosecond temporal resolution of 480 fs (sub-optical-cycle temporal regime is briefly discussed) achievable by this technique are demonstrated. (C) 2016 Optical Society of America