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Defect Segregation studied by Correlative Atom Probe Tomography and Electron Microscopy

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Gault,  Baptiste
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Herbig,  Michael
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Liebscher,  Christian
Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Kuzmina,  Margarita
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Dehm,  Gerhard
Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Ponge,  Dirk
Alloy Design and Thermomechanical Processing, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Scheu,  Christina
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Stoffers,  Andreas
Interface Design in Solar Cells, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Neugebauer,  Jörg
Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Raabe,  Dierk
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Citation

Gault, B., Herbig, M., Liebscher, C., Kuzmina, M., Dehm, G., Mayer, J., et al. (2016). Defect Segregation studied by Correlative Atom Probe Tomography and Electron Microscopy. Talk presented at Japan-Germany Joint Symposium on Advanced Characterization of Nanostructured Materials for Energy and Environment, Conference Center Mutterhaus,. Düsseldorf, Germany. 2016-06-29.


Cite as: https://hdl.handle.net/11858/00-001M-0000-002B-0FBF-E
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