Corrigendum to "Evidence for in-plane tetragonal c-axis in MnxGa1-x thin films 
using transmission electron microscopy" [Scr. Mater. 114 (2016) 165-169]

Karel, J.; Casoli, F.; Lupo, P.; Nasi, L.; Fabbrici, S.; Righi, L.; Albertini, F.; Felser, C.

doi:10.1016/j.scriptamat.2016.03.025

Item

ITEM ACTIONSEXPORT

Add to Basket

Please note that a newer version of this item is available:
https://pure.mpg.de/pubman/item/item_2309523_4

DetailsSummary

Released

Journal Article

Corrigendum to "Evidence for in-plane tetragonal c-axis in MnxGa1-x thin films using transmission electron microscopy" [Scr. Mater. 114 (2016) 165-169]

MPS-Authors

/persons/resource/persons126680

Karel, J.
Julie Karel, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

/persons/resource/persons126601

Felser, C.
Claudia Felser, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Karel, J., Casoli, F., Lupo, P., Nasi, L., Fabbrici, S., Righi, L., et al. (2016). Corrigendum to "Evidence for in-plane tetragonal c-axis in MnxGa1-x thin films using transmission electron microscopy" [Scr. Mater. 114 (2016) 165-169]. Scripta Materialia, 120, 112-112. doi:10.1016/j.scriptamat.2016.03.025.

Cite as: https://hdl.handle.net/11858/00-001M-0000-002A-F7FD-0

Abstract

The authors regret a typo on page 166 of the paper; the anisotropy (K1) values are in the range of 7–9 × 105 J/m3.