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Correlation between topological band character and chemical bonding in a Bi14Rh3I9 - based family of insulators

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Ruck,  Michael
Michael Ruck, Max Planck Fellow, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Citation

Rasche, B., Isaeva, A., Ruck, M., Koepernik, K., Richter, M., & van den Brink, J. (2016). Correlation between topological band character and chemical bonding in a Bi14Rh3I9 - based family of insulators. Scientific Reports, 6: 20645, pp. 1-7. doi:10.1038/srep20645.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0029-D2E6-4
Abstract
Recently the presence of topologically protected edge-states in Bi14Rh3I9 was confirmed by scanning tunnelling microscopy consolidating this compound as a weak 3D topological insulator (TI). Here, we present a density-functional-theory-based study on a family of TIs derived from the Bi14Rh3I9 parent structure via substitution of Ru, Pd, Os, Ir and Pt for Rh. Comparative analysis of the band-structures throughout the entire series is done by means of a unified minimalistic tight-binding model that evinces strong similarity between the quantum-spin-Hall (QSH) layer in Bi14Rh3I9 and graphene in terms of p(z) -molecular orbitals. Topologically non-trivial energy gaps are found for the Ir-, Rh-, Pt-and Pd-based systems, whereas the Os-and Ru-systems remain trivial. Furthermore, the energy position of the metal d-band centre is identified as the parameter which governs the evolution of the topological character of the band structure through the whole family of TIs. The d-band position is shown to correlate with the chemical bonding within the QSH layers, thus revealing how the chemical nature of the constituents affects the topological band character.