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A joint first principles and Kelvin Probe Force Microscopy study of stepped Silicon Surfaces with Unprecedented Resolution

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Wippermann,  Stefan Martin
Atomistic Modelling, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Pérez León, C., Drees, H., Marz, M., Wippermann, S. M., & Hoffmann-Vogel, R. (2015). A joint first principles and Kelvin Probe Force Microscopy study of stepped Silicon Surfaces with Unprecedented Resolution. Talk presented at APS March Meeting 2015. San Antonio, TX, USA. 2015-03-02 - 2015-03-06.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0029-7E0B-1
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