Ultrafast lattice response of photoexcited thin films studied by X-ray 
diffraction

Schick, Daniel; Herzog, Marc; Bojahr, André; Leitenberger, Wolfram; Hertwig, Andreas; Shayduk, Roman; Bargheer, Matias

doi:10.1063/1.4901228

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Ultrafast lattice response of photoexcited thin films studied by X-ray diffraction

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Herzog, Marc
Institut für Physik und Astronomie, Universität Potsdam;
Physical Chemistry, Fritz Haber Institute, Max Planck Society;

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Citation

Schick, D., Herzog, M., Bojahr, A., Leitenberger, W., Hertwig, A., Shayduk, R., et al. (2014). Ultrafast lattice response of photoexcited thin films studied by X-ray diffraction. Structural Dynamics, 1(6): 064501. doi:10.1063/1.4901228.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0027-9E45-5

Abstract

Using ultrafast X-ray diffraction, we study the coherent picosecond lattice dynamics of photoexcited thin films in the two limiting cases, where the photoinduced stress profile decays on a length scale larger and smaller than the film thickness. We solve a unifying analytical model of the strain propagation for acoustic impedance-matched opaque films on a semi-infinite transparent substrate, showing that the lattice dynamics essentially depend on two parameters: One for the spatial profile and one for the amplitude of the strain. We illustrate the results by comparison with high-quality ultrafast X-ray diffraction data of SrRuO₃ films on SrTiO₃ substrates.