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Grain boundary segregation in multicrystalline silicon: correlative characterization by EBSD, EBIC, and atom probe tomography

MPS-Authors
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Stoffers,  Andreas
Interface Design in Solar Cells, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Cojocaru-Mirédin,  Oana
Interface Design in Solar Cells, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zaefferer,  Stefan
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Raabe,  Dierk
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Stoffers, A., Cojocaru-Mirédin, O., Seifert, W., Zaefferer, S., Riepe, S., & Raabe, D. (2015). Grain boundary segregation in multicrystalline silicon: correlative characterization by EBSD, EBIC, and atom probe tomography. Progress in Photovoltaics: Research and Applications, 23(12), 1742-1753. doi:10.1002/pip.2614.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0027-BBB2-E
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