Bayesian derivation of electron temperature profile using JET ECE diagnostics

Schmuck, S.; Svensson, J.; de la Luna, E.; Figini, L.; Johnson, T.; Alper, B.; Beurskens, M.; Fessey, J.; Gerbaud, T.; Sirinelli, A.

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Bayesian derivation of electron temperature profile using JET ECE diagnostics

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Schmuck, S.
W7-X: Physics (PH), Max Planck Institute for Plasma Physics, Max Planck Society;

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Svensson, J.
W7-X: Physics (PH), Max Planck Institute for Plasma Physics, Max Planck Society;
W7-X: Heating and CoDaC (HC), Max Planck Institute for Plasma Physics, Max Planck Society;

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P5.046.pdf
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引用

Schmuck, S., Svensson, J., de la Luna, E., Figini, L., Johnson, T., Alper, B., Beurskens, M., Fessey, J., Gerbaud, T., & Sirinelli, A. (2011). Bayesian derivation of electron temperature profile using JET ECE diagnostics. In A., Becoulet, T., Hoang, & U., Stroth (Eds.), 38th European Physical Society Conference on Plasma Physics. Contributed Papers. Geneva: European Physical Society.

引用: https://hdl.handle.net/11858/00-001M-0000-0026-EB85-4

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