Grain boundary characterization in multicrystalline silicon using joint EBSD, 
EBIC, and atom probe tomography

Stoffers, Andreas; Cojocaru-Mirédin, Oana; Breitenstein, Otwin; Seifert, Winfried; Zaefferer, Stefan; Raabe, Dierk

doi:10.1109/PVSC.2014.6925089

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Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography

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Stoffers, Andreas
Interface Design in Solar Cells, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Cojocaru-Mirédin, Oana
Interface Design in Solar Cells, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zaefferer, Stefan
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Raabe, Dierk
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Stoffers, A., Cojocaru-Mirédin, O., Breitenstein, O., Seifert, W., Zaefferer, S., & Raabe, D. (2014). Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography. In 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014 (pp. 42-46).

引用: https://hdl.handle.net/11858/00-001M-0000-0024-90C8-8

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