Antiferromagnetic spin reorientation transition in epitaxial NiO/CoO/MgO(001) 
systems

Zhu, J.; Li, Q.; Li, J. X.; Ding, Z.; Liang, J. H.; Xiao, X.; Luo, Y. M.; Hua, C. Y.; Lin, H.-J.; Pi, T. W.; Hu, Z.; Won, C.; Wu, Y. Z.

doi:10.1103/PhysRevB.90.054403

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Antiferromagnetic spin reorientation transition in epitaxial NiO/CoO/MgO(001) systems

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Hu, Z.
Zhiwei Hu, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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引用

Zhu, J., Li, Q., Li, J. X., Ding, Z., Liang, J. H., Xiao, X., Luo, Y. M., Hua, C. Y., Lin, H.-J., Pi, T. W., Hu, Z., Won, C., & Wu, Y. Z. (2014). Antiferromagnetic spin reorientation transition in epitaxial NiO/CoO/MgO(001) systems. Physical Review B, 90:, pp. 1-7. doi:10.1103/PhysRevB.90.054403.

引用: https://hdl.handle.net/11858/00-001M-0000-0023-CF48-6

要旨

The magnetic properties of antiferromagnetic (AFM) spins were investigated using x-ray magnetic linear dichroism (XMLD) in epitaxial NiO/CoO/MgO(001) films as a function of film thickness, temperature, and interface modulation. We found that the NiO AFM spins undergo a spin reorientation transition (SRT) from the in-plane orientation to the out-of-plane orientation at a critical NiO thickness. The NiO AFM SRT can be attributed to the competition between the out-of-plane anisotropy of the NiO AFM spins and the AFM interfacial exchange coupling with the CoO in-plane spins. The NiO SRT thickness increases with the CoO thickness and also with the interfacial coupling strength. The temperature-dependent XMLD measurement indicates that the exchange coupling at the NiO/CoO interface can greatly enhance the Néel temperature of the CoO layer.