Charge fluctuations and image potential at oxide-metal interfaces

Altieri, S.; Tjeng, L. H.; Voogt, F. C.; Hibma, T.; Rogojanu, O.; Sawatzky, G. A.

doi:10.1103/PhysRevB.66.155432

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

Charge fluctuations and image potential at oxide-metal interfaces

MPS-Authors

There are no MPG-Authors in the publication available

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Altieri, S., Tjeng, L. H., Voogt, F. C., Hibma, T., Rogojanu, O., & Sawatzky, G. A. (2002). Charge fluctuations and image potential at oxide-metal interfaces. Physical Review B, 66(15): 155432, pp. 1-6. doi:10.1103/PhysRevB.66.155432.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-1770-D

Abstract

We analyze the dynamical response of the Ag metal surface to electronic excitations in a MgO(100)/Ag(100) oxide-metal interface system. Intrinsic and extrinsic surface plasmon excitations are discussed in relation to mutual interactions between the oxide and the metal. A direct relationship is established between the reduction of charge fluctuation energies in the MgO(100) layers and the image charge screening by the Ag(100) metal surface.