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Applications of the Kelvin Probe: From ion mobilty to x-ray/sample interaction

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Keil,  P.
Christian Doppler Laboratory for Metal/Polymer Interfaces, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Salgin,  B.
Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Vogel,  D.
Interface Structures and High-Temperature Reactions, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Rohwerder,  M.
Christian Doppler Laboratory for Diffusion and Segregation Mechanisms, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Citation

Keil, P., Salgin, B., Vogel, D., & Rohwerder, M. (2010). Applications of the Kelvin Probe: From ion mobilty to x-ray/sample interaction. Talk presented at Institute for X-Ray Physics, University of Göttingen. Göttingen, Germany. 2010-10-01.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-366B-B
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