Atomic resolution interface study of VN and Cu films on MgO using Cs corrected 
TEM

Dehm, Gerhard

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Atomic resolution interface study of VN and Cu films on MgO using Cs corrected TEM

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Dehm, Gerhard
Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Dehm, G. (2013). Atomic resolution interface study of VN and Cu films on MgO using Cs corrected TEM. Talk presented at Microscopy Conference MC 2013. Regensburg, Germany. 2013-08-25 - 2013-08-30.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-21FA-A

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