X-ray reflectivity study of layering transitions and the internal multilayer 
structure of films of three-block organosiloxane amphiphilic smectic liquid 
crystals at the air-water interface

Ibn-Elhaj, M.; Riegler, H.; Möhwald, H.; Schwendler, M.; Helm, C. A.

doi:10.1103/PhysRevE.56.1844

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X-ray reflectivity study of layering transitions and the internal multilayer structure of films of three-block organosiloxane amphiphilic smectic liquid crystals at the air-water interface

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Ibn-Elhaj, M.
Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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Riegler, H.
Hans Riegler, Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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Möhwald, H.
Helmuth Möhwald, Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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Ibn-Elhaj, M., Riegler, H., Möhwald, H., Schwendler, M., & Helm, C. A. (1997). X-ray reflectivity study of layering transitions and the internal multilayer structure of films of three-block organosiloxane amphiphilic smectic liquid crystals at the air-water interface. Physical Review E, 56(2), 1844-1852. doi:10.1103/PhysRevE.56.1844.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0015-7318-9

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