Transmission Electron Microscopy and High-Resolution Electron Microscopy Study 
of YNi2B2C Thin Film on Y2O3-Buffered MgO

Cao, G. H.; Simon, P.; Krämer, U.; Wimbush, S. C.; Holzapfel, B.

doi:10.1021/cm031044k

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Transmission Electron Microscopy and High-Resolution Electron Microscopy Study of YNi₂B₂C Thin Film on Y₂O₃-Buffered MgO

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Simon, P.
Paul Simon, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Cao, G. H., Simon, P., Krämer, U., Wimbush, S. C., & Holzapfel, B. (2004). Transmission Electron Microscopy and High-Resolution Electron Microscopy Study of YNi₂B₂C Thin Film on Y₂O₃-Buffered MgO. Chemistry of Materials, 16(5), 842-845. doi:10.1021/cm031044k.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0015-2F35-1

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