High-resolution core-level spectroscopy study of the ultrathin aluminum oxide 
film on NiAl(110)

Martin, N. M.; Knudsen, J.; Blomberg, S.; Gustafson, J.; Andersen, J. N.; Ingelsten, H.; Carlsson, P.-A.; Skoglundh, M.; Stierle, A.; Kresse, G.

doi:10.1103/PhysRevB.83.125417

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High-resolution core-level spectroscopy study of the ultrathin aluminum oxide film on NiAl(110)

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Stierle, A.
Former Central Scientific Facility ANKA Synchroton Beamline, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Martin, N. M., Knudsen, J., Blomberg, S., Gustafson, J., Andersen, J. N., Ingelsten, H., et al. (2011). High-resolution core-level spectroscopy study of the ultrathin aluminum oxide film on NiAl(110). Physical Review B, 83: 125417. doi:10.1103/PhysRevB.83.125417.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-4D30-2

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