Isotopic mass and lattice constant of Si and Ge: X-Ray standing wave 
measurements

Zegenhagen, J.; Kazimirov, A.; Cao, L. X.; Konuma, M.; Sozontov, E.; Plachke, D.; Carstanjen, H. D.; Bilger, G.; Haller, E.; Kohn, V.; Cardona, M.

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Isotopic mass and lattice constant of Si and Ge: X-Ray standing wave measurements

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Zegenhagen, J.
Max Planck Society;

Konuma, M.
Max Planck Society;

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Plachke, D.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Carstanjen, H. D.
Former Central Scientific Facility Pelletron Accelerator, Max Planck Institute for Intelligent Systems, Max Planck Society;
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

Cardona, M.
Max Planck Society;

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Zegenhagen, J., Kazimirov, A., Cao, L. X., Konuma, M., Sozontov, E., Plachke, D., et al. (2001). Isotopic mass and lattice constant of Si and Ge: X-Ray standing wave measurements. In N. Miura (Ed.), Proceedings of the 25th Conference on the Physics of Semiconductors (pp. 125-127). Berlin [et al.]: Springer.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-36FF-7

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