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Journal Article

Effects of thin film Nb interlayer in Cu/sapphire bonds

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Elssner,  G.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Former Central Scientific Facility Metallography, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Rühle,  M.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Liu, W. P., Elssner, G., & Rühle, M. (2001). Effects of thin film Nb interlayer in Cu/sapphire bonds. Materials Science and Engineering A-Structural Materials Properties Microstructure and Processing, 317(1-2 Sp. Iss. SI), 153-162.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-33FA-F
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