Plasmon energy mapping in energy-filtering transmission electron microscopy

Sigle, W.; Krämer, S.; Varshney, V.; Zern, A.; Eigenthaler, U.; Rühle, M.

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Plasmon energy mapping in energy-filtering transmission electron microscopy

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Sigle, W.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Krämer, S.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Zern, A.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Eigenthaler, U.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Scientific Staff Assembly Dual Beam, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Rühle, M.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Sigle, W., Krämer, S., Varshney, V., Zern, A., Eigenthaler, U., & Rühle, M. (2003). Plasmon energy mapping in energy-filtering transmission electron microscopy. Ultramicroscopy, 96, 565-571.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-2DE5-A

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