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Transfer of 2D Silica Films

MPG-Autoren
http://pubman.mpdl.mpg.de/cone/persons/resource/persons21408

Büchner,  Christin
Chemical Physics, Fritz Haber Institute, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons21628

Heyde,  Markus
Chemical Physics, Fritz Haber Institute, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons21524

Freund,  Hans-Joachim
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Zitation

Büchner, C., Heyde, M., & Freund, H.-J. (2018). Transfer of 2D Silica Films. In K. Wandelt (Ed.), Encyclopedia of Interfacial Chemistry (pp. 360-366). Amsterdam: Elsevier. doi:10.1016/B978-0-12-409547-2.14171-X.


Zitierlink: http://hdl.handle.net/11858/00-001M-0000-002E-976F-F
Zusammenfassung
2D silica bilayers are coordinatively self-saturated oxide layers with an SiO2 stoichiometry and well-defined thickness. They interact weakly with their substrate and can be grown with amorphous, crystalline, or a mixed topology. Recently, a mechanical exfoliation method has been presented that allows transferring the vapor-deposited films from the growth substrate to another support material. Throughout this procedure, no significant material loss or damage was observed. Based on this transferability, the incorporation of 2D silica films in various applications is feasible.