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Conference Paper

Towards a Quality Metric for Dense Light Fields

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons180686

Adhikarla,  Vamsi Kiran
Computer Graphics, MPI for Informatics, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons180939

Vinkler,  Marek
Computer Graphics, MPI for Informatics, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons205171

Sumin,  Denis
Computer Graphics, MPI for Informatics, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons45095

Myszkowski,  Karol
Computer Graphics, MPI for Informatics, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons45449

Seidel,  Hans-Peter
Computer Graphics, MPI for Informatics, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons44312

Didyk,  Piotr
Computer Graphics, MPI for Informatics, Max Planck Society;

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Citation

Adhikarla, V. K., Vinkler, M., Sumin, D., Mantiuk, R., Myszkowski, K., Seidel, H.-P., et al. (2017). Towards a Quality Metric for Dense Light Fields. In 30th IEEE Conference on Computer Vision and Pattern Recognition (pp. 3720-3729). Los Alamitos, CA: IEEE Computer Society. doi:10.1109/CVPR.2017.396.


Cite as: http://hdl.handle.net/11858/00-001M-0000-002D-E476-3
Abstract
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