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Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy

MPG-Autoren
http://pubman.mpdl.mpg.de/cone/persons/resource/persons201080

Harder,  Irina
Optical Design and Microoptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons201138

Nercissian,  Vanusch
Optical Design and Microoptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons201123

Mantel,  Klaus
Optical Design and Microoptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society;

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Zitation

Gao, P., Harder, I., Nercissian, V., Mantel, K., & Yao, B. (2010). Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy. OPTICS LETTERS, 35(5), 712-714.


Zitierlink: http://hdl.handle.net/11858/00-001M-0000-002D-6B29-4
Zusammenfassung
A new common-path and in-line point-diffraction interferometer for quantitative phase microscopy is proposed. The interferometer is constructed by introducing a grating pair into the point-diffraction interferometer, thus forming a common-path and in-line configuration for object and reference waves. Achromatic phase shifting is implemented by linearly moving one of the two gratings in its grating vector direction. The feasibility of the proposed configuration is demonstrated by theoretical analysis and experiments. (C) 2010 Optical Society of America