Scanning photothermal beam deflection imaging with and without contrast 
inversion on polymers for integrated optical application

Einsiedel, H.; Mittler-Neher, Silvia

doi:10.1016/S0040-6090(96)08842-6

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Scanning photothermal beam deflection imaging with and without contrast inversion on polymers for integrated optical application

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Einsiedel, H.
MPI for Polymer Research, Max Planck Society;

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Mittler-Neher, Silvia
MPI for Polymer Research, Max Planck Society;

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Einsiedel, H., & Mittler-Neher, S. (1996). Scanning photothermal beam deflection imaging with and without contrast inversion on polymers for integrated optical application. Thin Solid Films, 288(1-2), 243-247. doi:10.1016/S0040-6090(96)08842-6.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0024-BC5C-2

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