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Thickness dependent exchange bias in martensitic epitaxial Ni–Mn–Sn thin films

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons125119

Dutta,  Biswanath
Computational Phase Studies, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons125180

Hickel,  Tilmann
Computational Phase Studies, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Behler, A., Teichert, N., Dutta, B., Waske, A., Hickel, T., Auge, A., et al. (2013). Thickness dependent exchange bias in martensitic epitaxial Ni–Mn–Sn thin films. AIP Advances, 3(12): 122112. doi:10.1063/1.4849795.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0024-B37A-2
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