Transmission electron microscopy of fluorapatite-gelatine composite particles 
prepared using focused ion beam milling

Volkert, C. A.; Busch, S.; Heiland, B.; Dehm, G.

doi:10.1111/j.0022-2720.2004.01352.x

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

Transmission electron microscopy of fluorapatite-gelatine composite particles prepared using focused ion beam milling

MPS-Authors

/persons/resource/persons126558

Busch, S.
Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Volkert, C. A., Busch, S., Heiland, B., & Dehm, G. (2004). Transmission electron microscopy of fluorapatite-gelatine composite particles prepared using focused ion beam milling. Journal of Microscopy, 214, 208-212. doi:10.1111/j.0022-2720.2004.01352.x.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0015-2DE6-1

Abstract

There is no abstract available