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Electron Microscopy and Holography of Nanobricks of Si and Ge Clathrates

MPS-Authors
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Simon,  P.
Paul Simon, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Carrillo-Cabrera,  W.
Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Baitinger,  M.
Michael Baitinger, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Grin,  Y.
Juri Grin, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Guloy,  A. M.
Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Citation

Simon, P., Carrillo-Cabrera, W., Zhongjia, T., Chiong, K., Baitinger, M., Grin, Y., et al. (2010). Electron Microscopy and Holography of Nanobricks of Si and Ge Clathrates. Nanofair 2010 - 8th International Nanotechnology Symposium, Session analytics I.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0015-24A2-0
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