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Conference Paper

Electron Microscopy and Holography of Nanobricks of Si and Ge Clathrates

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons126855

Simon,  P.
Paul Simon, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons126563

Carrillo-Cabrera,  W.
Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons126529

Baitinger,  M.
Michael Baitinger, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons126626

Grin,  Y.
Juri Grin, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons126631

Guloy,  A. M.
Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Citation

Simon, P., Carrillo-Cabrera, W., Zhongjia, T., Chiong, K., Baitinger, M., Grin, Y., et al. (2010). Electron Microscopy and Holography of Nanobricks of Si and Ge Clathrates. Nanofair 2010 - 8th International Nanotechnology Symposium, Session analytics I.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0015-24A2-0
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